Abstract

Specific features of the current processes in silicon heterojunction with intrinsic thin layer solar cells have been investigated. The proposed model takes into account the ambipolar motion of carriers and allows one to calculate the operating characteristics at an arbitrary ratio of the diffusion length and the crystalline-substrate thickness. A numerical method for estimating the recombination-loss rate on silicon wafer surfaces based on the comparative analysis of the experimental values of short-circuit current and open-circuit voltage is described.

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