Abstract

We characterize spall damage in shock-recovered ultrapure Al with metallography and x-ray tomography. The measured damage profiles in ultrapure Al induced by planar impact at different shock strengths, can be described with a Gaussian function, and showed dependence on shock strengths. Optical metallography is reasonably accurate for damage profile measurements, and agrees within 10–25% with x-ray tomography. Full tomography analysis showed that void size distributions followed a power law with an exponent of γ = 1.5 ± 2.0, which is likely due to void nucleation and growth, and the exponent is considerably smaller than the predictions from percolation models.

Highlights

  • Damage of ductile metals under high strain rate loading has long been studied with planar shock loading

  • Full tomography analysis showed that void size distributions followed a power law with an exponent of γ = 1.5 ± 2.0, which is likely due to void nucleation and growth, and the exponent is considerably smaller than the predictions from percolation models

  • The soft-recovered samples were examined with 2D metallography and 3D x-ray tomography, and results are shown in Figs. 2–6 and Table I

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Summary

Introduction

Damage of ductile metals under high strain rate loading has long been studied with planar shock loading. Void nucleation and growth coupled with plasticity, are responsible for shock-induced spallation damage, and such information is extremely useful for developing physics-based, dynamic damage models.[1,2,3,4,5] in situ, real time measurements are largely limited to free surface or target-window interface velocities, since the technical challenges still render such measurements a formidable task on void evolution in ductile metals. Damage characterization has heavily relied on shock-recovered samples, which are normally examined with optical metallography, scanning and transmission electron microscopy, and electron backscattered diffraction.[6,7,8,9,10] These techniques are mostly two-dimensional (2D) in nature, and one has to resort to serial sectioning, or stereographic techniques such as the Schwartz-Saltykov method, to obtain 3D information.[11,12,13,14,15] C Author(s) 2014

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