Abstract

We propose and demonstrate a metal-dielectric thin film that delivers low reflection and high absorption over the entire visible spectrum. This thin black film consists of SiO<sub>2</sub>/Cr/SiO<sub>2</sub>/Al layers deposited on glass substrate. Measured reflectance and absorptance of the black film are 0.7% and 99.3%, respectively, when averaged over the range 380-780 nm. The total thickness of the black film is only about 220 nm. This thin black film can be used as a thin absorbing layer for displays that require both broadband anti-reflection and high contrast characteristics.

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