Abstract
AbstractA new dynamic microphysical model of the melting layer is presented, developed from a previous model. This new model is applied to obtain vertical reflectivity profiles (VRPs) and vertical attenuation profiles (VAPs) through the melting layer which both allow for and neglect propagation effects. The model profiles are compared with measured profiles at a range of different frequencies; in particular, a detailed comparison was made for frequencies in the X‐band. The VRPs are used to generate relations between bright‐band peak‐intensity and surface rainfall‐rate, R0, at frequencies in the S‐, C‐ and X‐bands. Relations between other model bright‐band parameters and R0 are found to be more complicated functions of model‐input parameters. The model profiles are also applied to the problem of correcting for the radar bright‐band in the Meteorological Office's radar data. Early results, from three detailed case studies, seem promising; however, the technique has yet to be tested in an operational environment.
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