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Abstract
The electronic structure and x-ray photoelectron spectra of silicon with octahedral B6 clusters are investigated using first-principles calculations. It is found that the B6 clusters act as double acceptors in silicon and that the simulated chemical shift of the B1s orbital signals of the B6 clusters in x-ray photoelectron spectra coincides with the chemical shift of B1s experimentally observed in as-implanted silicon at an extremely high dose of boron. These results reveal that the B6 clusters are the origin of hole carriers. We propose a mechanism of hole generation and a model of B6 cluster formation at implantation-induced divacancy sites.
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