A mechanically reliable digital-type single crystalline silicon (SCS) RF MEMS variable capacitor

Abstract

This paper reports the first demonstration of a single crystalline silicon(SCS)-based vertical gap-tuning MEMS variable capacitor with high mechanical reliability using the SiOG (silicon-on-glass) process. The proposed variable capacitor was fabricated by silicon-based micromachining technology, and its mechanical and electrical performances were tested. By adopting SCS, which has nearly zero stresses and superior thermal characteristics as a structural material, we can improve the manufacturability, reproducibility and mechanical reliability of the fabricated devices compared with a conventional metallic variable capacitor. The variable capacitor described in this paper is fabricated on a coplanar waveguide (CPW) transmission line and the top electrode in the driving part is incorporated with a SCS actuating membrane, resulting in a highly rigid structure without structural deformations. The designed SCS variable capacitor is actuated by an electrostatic force, and the total chip size is 1.05 mm × 0.72 mm. The measured pull-in voltage was 37 V, and the RF characteristics of the fabricated SCS variable capacitor from dc to 40 GHz were measured. With and without an applied dc bias voltage, the measured S11 and S21 were changed from −15.6 to −5.1 dB, and from −0.49 to −2.3 dB at 30 GHz, respectively. The measured capacitance at the up and the down states was 30 and 140 fF, respectively, which corresponds to the capacitance ratio of 4.67. The mechanical lifetime of the fabricated variable capacitor was also measured. RF performance degradation and stiction problems were not observed, even after 108 cycles of repeated actuations.