Abstract
The half-life of the 59.2 keV X-radiation following the decay by orbital electron capture of181W has been measured to be (126.2±3.2) days. The measurement was made using a source electromagnetically enriched in180W before irradiation. In order to insure that the possible low-energy radiation from185W was not influencing the measurements, a calculation was made to show that this contamination was not a problem. An additional measurement on a natural tungsten source confirmed the results of the calculation.
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