Abstract
Error vector magnitude (EVM) is a measure of the transceiver's modulation accuracy representing any deviation from the ideal bit location. It can fully indicate system level performance of the device. If the device meets the EVM margin specifications then it is assured that the function in the final application. That's why nowadays more and more fabless are using EVM testing in mass production to screen their RF product to achieve lower field return. While in mass production, the EVM result is the combination of both device EVM performance and test system's performance. Even if the device has a good EVM, the noisy ATE system will make the final measurement result poor so as to "kill" the good parts. This paper will provide a mathematical model to estimate how much impact will happen on the device test with ATE's specification so as to help designer to select the RIGHT ATE to test their RF products.
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