Abstract
A model for the relationship between local permittivity variation and capacitance change is presented. The model is applicable to multi-electrode capacitance sensors which have been used for tomographic imaging of multi-phase processes. An explicit formula is derived for the relationship between permittivity in a small spherical region and sensor response. The predictions from this model are compared with results from a high-precision finite element simulation. Good agreement is shown. A simple tomographic reconstruction algorithm which uses this sensor model is introduced. Results show that accurate reconstruction of permittivity distribution is possible for certain test cases.
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