Abstract
This paper presents an incremental delta sigma analog to digital converter (ADC) using an extended counting technique for CMOS image sensors. A modified extended counting method is proposed to reduce the over sampling ratio (OSR) and consequently increase conversion speed without increasing the hardware complexity. To further reduce the chip size and power consumption, a self-biased amplifier is shared between the adjacent stages of the delta-sigma modulator. The proposed ADC is fabricated in a 0.18-㎛ CMOS image sensor process and occupies 0.0026 ㎟. It achieves 65 ㏈ of signal noise and distortion ratio (SNDR) for a signal bandwidth of 156.25 ㎑ with a 20 ㎒ operating clock and consumes 45 μW from a 1.8 V power supply. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are +0.49 / −0.22 and +0.61 / −0.64 LSB (least significant byte), respectively.
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