A low-power 1 MHz, 25 mW 12-bit time-interleaved analog-to-digital converter

Abstract

A 12-bit 1 Msample/s 25 mW analog-to-digital converter was designed. Linearity, offset, and gain errors of less than 1/2 LSB have been achieved using an EEPROM memory trimming scheme. The EEPROM memory array, programmed during testing, continuously drives a correction digital-to-analog converter (DAC) with code dependent correction factors. The analog-to-digital converter (ADC) uses a time-interleaved multistep architecture consisting of two banks of comparator arrays sharing a common reference ladder and EEPROM correction memory. A static EEPROM memory array optimizes the power dissipation, conversion rate, inter-stage gain errors, and charge injection. The resulting converter achieves high speed operation with minimal power dissipation.