Abstract
The system Si(111)Au is studied in the submonolayer range between about 550 and 1100 K by low-energy electron microscopy (LEEM) in situ in real time with the goal to understand the microscopic aspects of the film formation and of the phase transitions of the various phases ((5 × 1), (√3 × √3) R30° and (6 × 6)) found in this system at elevated temperatures.
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