Abstract
A new method for wireless interrogation of a passive SAW sensor with multiple reflectors, utilizing the signal interference during overlap of the sensor's response bursts, is introduced. Within this time interval, the amplitude or the phase, respectively, is measured. By varying the frequency of the relatively long interrogation bursts, the amount of interference and destructive interferences (notches) are searched, respectively. So the measurand influencing the sensor or its identification information can be gained. The principle yields high resolution with a low cost interrogating system. The basic principle, calculations of sensitivity, and experimental results for temperature measurements are presented. The hardware effort and the performance of the system are discussed.
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