Abstract
The Editor-in-Cheif is pleased to present this July-August issue, which brings you a combination of articles that cover a rich set of academic and industrial work addressing state-of-the-art issues of design, verification, and test of different IC-based systems represented at different levels of abstraction. The figure of merit for the different approaches varies, depending on the specific case, but are generally variations of cost, performance, quality, yield, and feasibility. An overview of each of the technical articles and features is presented.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
