Abstract
This paper presents a method to estimate the inverter lifetime so that we can predict a failure prior to it actually happening. The key contribution of this study is to link the physics of the power devices to a large scale system simulation within a reasonable framework of time. By configuring this technique to a real system, it can be used as a converter design tool or online lifetime estimation tool. In this paper, the presented method is applied to the grid side inverter to show its validity. A power cycling test is designed to gather the lifetime data of a selected insulated gate bipolar transistor (IGBT) module (SKM50GB123D). Die-attach solder fatigue is found out to be the dominant failure mode of this IGBT module under the designed accelerated tests. Furthermore, the crack initiation is found to be highly stress dependent while the crack propagation is almost independent with stress level. Two different damage accumulation methods are used and the estimation results are compared.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
