Abstract
An intensity analysis with low-energy electron diffraction is reported for the c(2 × 2) structure obtained by the adsorption (and presumed dissociation) of H 2S on Rh(110). Intensity versus energy curves were measured for 14 diffracted beams at normal incidence, and comparisons made with I(E) curves calculated with the layer-doubling method for four different structural models. The best correspondence, as judged by a reliability index proposed by Zanazzi and Jona, is with sulphur atoms in the centre (four-fold) adsorption sites and 0.77 Å above the topmost rhodium layer. In this model, each sulphur atom is 2.12 Å above a rhodium atom in the second metal layer and 2.45 Å from the four nearest-neighbour rhodium atoms in the topmost metal layer.
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