Abstract
The Laue technique shortens the time required to measure integrated intensities for X-ray structure determination. The Laue diffractometer presented here is a δ-circle diffractometer equipped with an ordinary low-cost photomultiplier-scintillation-crystal combination. Stepper-motor control devices and the multichannel analyzer (MCA) were originally developed for this particular purpose. These components are equipped with efficient microprocessor technology. A personal computer with graphic facilities is used for processing. Using special procedures in the analysis and the measurement of data, the disadvantages of a scintillation counter may be avoided or reduced.
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