Abstract
Defect detection is a crucial but challenging task in thin film transistor liquid crystal display (TFT-LCD) manufacturing. Existing vision-based methods focus on either spatial domain or frequency domain with unsatisfactory detection. In view of that, this paper proposes a hybrid template matching method by drawing benefits from both frequency and spatial domain techniques. Under proposal, frequency domain template matching method and saliency detector method are firstly adopted separately to obtain two candidate frequency components associated with defects. In template matching process, a novel selection criterion is taken to improve identifying components associated with local spatial anomaly. Subsequently, the inverse Fourier transform is applied on the intersection of the two candidates to reconstruct the defect regions. In final steps, image entropy in the spatial domain is employed to filter out false detection regions to improve accuracy. To meet industry’s real-time inspection requirement, image partition and multi-threading calculation techniques are introduced into the proposed methodology. Experimental results have shown practical viability of the proposed approach to increase the yield rate of panels through robust defect detection in TFT-LCD manufacturing.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
