Abstract
The increase of complexity on integrated circuits has al so raised the demand for new testing methodologies capable to detect functional failures within circuits before they reach the market. Hence, this work proposes to explore the use of homotopy a s a tool for testing a basic analog circuit. The homotopy path is influenced by nonlinearities f rom the equilibrium equation of the circuit; this situation can be used to infer faults by det ecting changes on the homotopy path. The concept was explored using numerical simulation of a simple test circuit; then comparing results for the circuit with and without faults, obtaining modificat ions on the homotopy path like: the final point, number of iterations, and the number of turni ng points.
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