Abstract

It is difficult to measure the track structure and coverage of the localizer of the instrument landing system by general test instruments, the main way to do that is flight inspection, which collecting and analyzing signals emitted by navigation equipment, during the flight. However, this method of measurement costs too much and must be operated by professional pilots. To realize the dynamic measurement and analysis of track structure and coverage, and accurately describe the dynamic characteristics of its spatial signals, a large amount of data needs to be collected. Navigation equipment test system mainly adopts mature low-speed data acquisition technology, which cannot meet the requirement of high-speed data acquisition. In the market, the single-chip high-speed ADC converter has high price and low resolution, and the application of the single-chip ultra-high-speed ADC converter to achieve data acquisition has posed a severe challenge to the performance of the processing system. This paper proposes a clock multi-phase technique, which can realize multi-channel parallel sampling, improve the rate and sampling precision of analog-to-digital conversion, and track the variation characteristics of spatial signal of the course structure and the coverage more accurately.

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