Abstract
This paper describes a high-quality switched-capacitor sine-wave oscillator for on-chip analog testing. At the core of the oscillator is a high-Q bandpass filter whose selectivity is programmed by using a non-uniform sampling scheme. As a result, capacitor spread and total capacitor area can be reduced and, hence, test area overhead is minimized. Experimental results from a 0.35-/spl mu/m CMOS test-chip that generates signals with frequencies up to 1 MHz are presented.
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