A highly sensitive method for rare-earth element analysis using ionoluminescence combined with PIXE

Abstract

In Ion Beam Analysis (IBA), a beam of energetic particles (a few MeV/amu) is normally employed. Particle induced X-ray emission (PIXE) is one of the well-established IBA methods for accurate element analysis with the capabilities of a low detection limits and the absolute quantification for many elements. Nevertheless, for intermediate elements, including rare-earth elements (REEs), the experimental detection limits of PIXE in analysis of some geological materials are too high. The IonoLuminescence (IL) method is a sensitive analytical method for REE analysis based on the facts that the luminescence emission lines for REEs are characterised by narrow peak, stable position and high yields in a variety of minerals. Thus, similar to PhotoLuminescence (PL) and CathodoLuminescence (CL), the IL can be employed as a sensitive method for REE study. In the present work, synthetic minerals such as zircon and calcite separately doped various single REE were studied by combined IL and PIXE. An apatite standard sample containing several REEs was also investigated. The IL detection limits of most REE elements involved were estimated much lower than those offered by PIXE.