Abstract
A high-resolution spectrometer for the wavelength range 40-200 nm was adapted to a high-speed photo-electric detection system. A wavelength range of 3 nm can be measured up to every 0.2 ms with a resolution of 0.0012 nm and a wavelength accuracy of 0.0001 nm. The system is used for plasma spectroscopy at the Rijnhuizen Tokamak Project. Temperature measurements were performed with a resolution of 0.1 eV and changes in rotation velocity of were observed.
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