Abstract
A white-light interferometry-based high-resolution technique for strain measurement using an extrinsic Fabry–Perot interferometer (EFPI) and a compensating EFPI is demonstrated. The phase difference between the two white-light optical spectra is calculated by a Fourier- transform-based technique. From this phase difference, the difference in cavity length between the two EFPIs is calculated. This, in turn, is used to measure strain. A strain resolution of 8.27 × 10−3 µε is achieved.
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