A high resolution projectile electron spectrometer

Abstract

A design is presented for a double-pass position sensitive 30° parallel plate electron spectrometer, which reduces to second order the Doppler broadening inherent in the Auger electron spectra emitted from fast ion beams. A computer controlled translation-rotation stage is used to locate a position sensitive detector, consisting of a 8 × 50 mm 2 Chevron microchannel plate detector with resistive anode readout, along the computed second order “focal line”. An electron energy spectrum having a width ΔE E = 0.50 , may be acquired at a single analysing voltage. This gives the new spectrometer an electron detection efficiency of over 200 times that of a conventional multiscaling parallel plate analyser. Observation angles of 9° – 171°, 0° and 180° are possible with this spectrometer. High resolution projectile Auger electron measurements are possible and planned experiments are discussed.