Abstract
We report a silicon crystal monochromator with an angular acceptance of 14.1 μrad and an energy bandwidth of 3.6 meV at 23.880 keV X-ray energy – an energy resolution δE/ E of 1.5×10 −7. In combination with an undulator source, the monochromator is used to measure the partial phonon density of states of Sn in 119 SnO 2 by the method of inelastic nuclear resonant scattering using the 23.880 keV nuclear transition of 119 Sn .
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