Abstract
A high-Q mid-infrared Tamm plasmon (TP) absorber using MgF2 and Ge aperiodic tandem films is designed by the genetic algorithm and fabricated by electron beam evaporation and magnetron sputtering. Such a design circumvents the need for the distributed Bragg reflector grating, and the thickness of individual MgF2 films is much smaller than a quarter of wavelength in films (λ/4n). The fabricated TP absorber exhibits a high and sharp absorption peak at 2.73 μm with a quality factor (Q) of 144, while the simulated counterpart has the absorption peak at 2.72 μm with a Q of 155. The profiles of an electromagnetic field in the tandem films are also simulated to reveal the mechanism of narrow thermal emission. Such a high-Q TP absorber is very promising in the mid-infrared simulator and detection.
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