Abstract
Accelerator-based fourth-generation light sources are utilized in a wide range of interdisciplinary applications such as nanotechnology, materials science, biosciences, and medicine. A hard X-ray free-electron laser (FEL), as a state-of-the-art light source, was optimized using evolutionary algorithms for dedicated user applications such as X-ray Raman scattering (XRS), resonant inelastic X-ray scattering (RIXS), and X-ray emission spectroscopies (XES). Optimal parameter sets were obtained for an in-vacuum planar undulator driven by an 8 GeV electron beam. Performance parameters of self-amplified spontaneous emission (SASE) operation (i.e. optimized SASE performance parameters through evolutionary algorithms) were found to be consistent with operating X-ray FEL facilities around the world. It is shown that FEL characteristics for specific user experiments can be optimized by finding several evolutionary algorithm solutions within the range of 5 keV to 10 keV.
Highlights
The unprecedented beam properties provided by X-ray free-electron laser (XFELs) have paved the way for the ultrasmall, ultrafast world [1,2]
A hard X-ray free-electron laser was optimized for dedicated user experiments such as X-ray Raman scattering (XRS), RIXS, and X-ray emission spectroscopies (XES)
Since the compact and portable spectrometer mentioned above can operate in the energy range of 5–10 keV, crucial performance parameters for spontaneous emission (SASE) operation are estimated by using evolutionary algorithms
Summary
The unprecedented beam properties provided by X-ray free-electron laser (XFELs) have paved the way for the ultrasmall, ultrafast world [1,2]. XFEL radiation makes it possible to track the dynamics of chemical processes by taking snapshots of the motion of atoms, molecules, and clusters on an ultrafast timescale with atomic resolution. It offers the possibility of investigating samples that are sensitive to radiation damage, weakly scattering samples, and time-resolved processes that are irreversible. Using ultrafast and intense pulses, the structure can be determined by X-ray scattering in a single shot before radiation damage occurs [3]. X-ray pulses with a large number of photons can be focused on a spot that is approximately the size of a virus or the smallest structures fabricated on an electronic chip. XFELs provide unique possibilities for the generation and diagnosis of dense, strongly coupled plasmas as well as warm dense matter research [4,5]
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