Abstract
The Hard X-ray Nanoprobe Beamline (or Nanoprobe Beamline) is an X-ray microscopy facility incorporating diffraction, fluorescence and full-field imaging capabilities designed and operated by the Center for Nanoscale Materials and the Advanced Photon Source at Sector 26 of the Advanced Photon Source at Argonne National Laboratory. This facility was constructed to probe the nanoscale structure of biological, environmental and material sciences samples. The beamline provides intense focused X-rays to the Hard X-ray Nanoprobe (or Nanoprobe) which incorporates Fresnel zone plate optics and a precision laser sensing and control system. The beamline operates over X-ray energies from 3 to 30 keV, enabling studies of most elements in the periodic table, with a particular emphasis on imaging transition metals.
Highlights
In the last few decades the technology and methods developed for synchrotron X-ray research have contributed significantly to our understanding of structural biology (Doyle et al, 1998; Schotte et al, 2003), materials science (Srajer et al, 2006; Poulsen et al, 2001; Banhart et al, 2001) and condensed-matter physics (Reichert et al, 2000; Alagna et al, 1998)
The unique capabilities of the beamline provide for the operation of a state-of-the-art microscope, the Hard X-ray Nanoprobe
A detailed description of the design and performance of the Hard X-ray Nanoprobe is provided in an additional publication (Winarski et al, 2012)
Summary
In the last few decades the technology and methods developed for synchrotron X-ray research have contributed significantly to our understanding of structural biology (Doyle et al, 1998; Schotte et al, 2003), materials science (Srajer et al, 2006; Poulsen et al, 2001; Banhart et al, 2001) and condensed-matter physics (Reichert et al, 2000; Alagna et al, 1998). A detailed description of the design and performance of the Hard X-ray Nanoprobe is provided in an additional publication (Winarski et al, 2012) These capabilities facilitate other pioneering developments that focus on highest-resolution X-ray microscopy (Yan et al, 2011; Cummings et al, 2012; Rose et al, 2011). A combination of nanofocusing X-ray optics and precision motion sensing and control enables detailed studies of the internal features of samples with a resolution approaching 30 nm. 1056 doi:10.1107/S0909049512036783 mination from two undulators in series This placed unique design requirements on the optical components for the beamline. The precision optics manipulation necessary for imaging at a resolution approaching 30 nm required the development of unique sensing and motion controls to ensure accurate detection of features inside of samples. The Nanoprobe optics and controls platforms were designed to achieve a spatial resolution of 10 nm with the future development of higher-resolution zone plates
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