Abstract
The crystallization behavior and morphology of poly(3-hydroxybutyrate) (PHB) ultrathin films sandwiched between Si wafers and amorphous thin polymer layers were studied by using grazing incident X-ray diffraction (GIXD) technology.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
