Abstract
Batch processing is used extensively in the production of high value products, and there are strong economic incentives for developing methodologies for ensuring the successful completion of batches via process monitoring and fault detection. Building on our previous work using time-explicit Kiviat diagrams for continuous processes, this paper introduces data visualization, data-driven process monitoring and fault detection for batch systems. Handling batch data, including unfolding and alignment are addressed as well. The proposed methodology is demonstrated on data obtained from a benchmark bioreactor simulator and a semiconductor etching process.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
