Abstract
We present the Debye model parameters of four materials which are extensively used in the field of electronics and photonics. The parameters have been extracted using a Genetic Algorithm (GA) based technique. We have determined the complex relative permittivity using the extracted modeling parameters and compared with the experimentally obtained ones. A very good agreement has been found in each case which validates our extracted parameters. The associated root-mean-square (RMS) deviations have been found to be 0.3894, 0.026, 0.8163 and 0.4370 for graphene, graphene oxide, aluminum zinc oxide (AZO) and gallium zinc oxide (GZO) respectively.
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