Abstract
Abstract We describe a new robust approach for the analysis of strip gratings, both of finite and infinite conductivity, for the TE and TM cases. The field distributions in the plane of the grating are expanded in a Fourier series, whose coefficients are derived as the solution to an infinite-dimensional system of linear equations. Various configurations of the scatterer are considered and it is shown that even in cases where the Tsao-Mittra SIT procedures fails to converge and the moment method requires a large matrix to arrive at a solution, our method yields reasonable results even for small matrix sizes. The accuracy of the solution procedure is analysed by considering the mean-square error in the field magnitudes as a function of the truncation size of the infinite system of linear equations.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
