Abstract
A new general method for calculation of thin-film-distributed resistive structures is presented. This method is based on the conformal mapping of the analyzed domain on the complex upper half-plane and the determination of the complex potential function as the solution of a boundary-values Volterra problem. Although the method inherently applies only to single-connected domains with known conformal representations on the upper half-plane, it may be extended also to other symmetrical multiple-connected configurations and in all cases when the positions of the conducting terminals in the upper half-plane are known. Two examples of application are given.
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