Abstract

A fully coupled FE model for mixed EHL of finite line contacts is proposed, integrating all of the governing equations into a monolithic system. The solution reveals the fully coupled model achieves 5% higher accuracy and 50% greater efficiency compared to the weakly coupled one. Additionally, there is evidence to support the assertion that profiling contributes to the mitigation of surface roughness contact. Logarithmic profiling can increase the minimum film thickness by a factor of 30, resulting in a reduction of up to 64.6% in the maximum asperity contact pressure, and thus, the boundary friction force is decreased by more than 19%, under heavy-load low-velocity condition. This contributes to the reduction of abrasive wear.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.