A framework for general-purpose microscopic image analysis via self-supervised learning

Abstract

Combining materials science, artificial intelligence (AI) offers great potential for the extensive quantitative analysis and processing of material characterization associated with high-throughput experiments. However, due to the complex and diverse morphology of structural components, the development of AI models requires substantial annotation and models are usually task-specific with limited generalizability to different clinical applications. Here, we present a universal self-supervised learning framework for microscopic images. Our framework learns generalizable representations from unlabelled images and provides a pixel-wise segmentation for quantitative microstructure analysis in a variety of materials science applications. Specifically, the framework learns feature from a single image by means of self-supervised learning, and adapts it to a series of related tasks. We show that our method consistently outperforms several comparisons supervised or weakly supervised learning models in the context of various applications. Our approach provides a generalizable solution to improve model performance and alleviate the annotation workload of experts to enable practical AI applications from microscopic imaging.