Abstract
It has been recognized that stress has a significant effect on the electrical characteristics of pn-junction devices [1]. Several parameters change by an order of magnitude. Intensive theoretical investigations have been carried out in order to explain the effects of mechanical stress on pn junctions [1 - 3, 5] A first-order model is presented, starting from the theory of pressure upon the carrier densities and the change in minority carrier densities [1-3]. This model provides expression for the current gain β and the base-emitter voltage V BE as functions of the applied stress. The results of experimental work are in good agreement with this model [4]. The results of several authors are compared and used in order to obtain a force transducer for forces between the teeth. This sensor makes use of the linear variation of the base-emitter voltage with the force. Results of measurements with this transducer are included. Special attention has been paid to the simultaneous effects of current gain variations and base-emitter voltage variations.
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