A flexible fast 3D profilometry based on modulation measurement

Abstract

This paper proposes a flexible fast profilometry based on modulation measurement. Two orthogonal gratings through a beam splitter are vertically projected on an object surface, and the measured object is placed between the imaging planes of the two gratings. Then the image of the object surface modulated by the orthogonal gratings can be obtained by a CCD camera in the same direction as the grating projection. This image is processed by the operations consisting of performing the Fourier transform, spatial frequency filtering and inverse Fourier transform. Using the modulation distributions of two grating patterns, we can reconstruct the 3D shape of the object. In the measurement process, we only need to capture one fringe pattern, so it is faster than the MMP and remains the advantages of it. In the article, the principle of this method, the setup of the measurement system, some simulations and primary experiment results are given. The simulative and experimental result proves it can restore the 3D shape of the complex object fast and comparatively accurate. Because only one fringe pattern is needed in the testing, our method has a promising extensive application prospect in real-time acquiring and dynamic measurement of 3D data of complex objects.