Abstract
The vapour pressures of materials and the enthalpy changes associated with their sublimation and evaporation are often necessary parameters for many processes. This paper reviews the origins and development of a method for determining these properties using a conventional thermobalance and sample holders with a modified form of the Langmuir equation. Alternative approaches for data treatment are discussed, many of which promise to derive the vapour pressure of a material directly rather than by calibration with reference materials. The applications of non-linear rising temperature programs are considered and a protocol for correction of volatilisation rate to take into account the diffusion-limited transfer of material through the stagnant boundary layer above the sample is proposed.
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