Abstract
AbstractThe model of the finite defect chain is used to calculate the trap distributions caused by a defect chain with a uniform curvature. For spherical potentials not belonging to the Coulomb‐type analytical solutions are obtained. This paper shows that any spatial defect chain causes essentially trap distributions with exponential characteristics in the solid.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
