Abstract
Thin-film photovoltaic (PV) module production is expected to continue growing in importance among the total PV production capacity in the near future. More than half the companies working nowadays on thin-film PV modules is focusing on a-Si based technologies, among which the multi-junction structures have demonstrated laboratory efficiencies above 10%. Multi-junction devices present several challenges in the development of dedicated measurement procedures. Among those, the measurement of the spectral response of large area modules has been investigated recently. Several solutions have been found since the 1990s to overtake the small-size monochromatic beam limitation: some of those are briefly revised. The authors also present a newly developed setup based on a large area pulsed solar simulator with bandpass filters to produce the uniform monochromatic beam and with powerful LED floodlight to allow current-limitation from the component junction under investigation. Examples of measurements with a variety of multi-junction commercial modules are presented.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
