Abstract

The utility of the field emission microscope in studying individual nanometer-sized clusters is demonstrated. Preformed Au clusters of controlled size are deposited on a W(110) field emitter. The field emission characteristics of the supported clusters are studied after each of a series of heating cycles in which the temperature of the W tip is raised from room temperature to a predetermined high temperature and then cooled again to room temperature. An abrupt change in the current-voltage characteristics from a supported cluster is found to occur at a definite transition temperature. This phenomenon, which is accompanied by a change in the field emission pattern, is interpreted as a melting transition that results in the cluster spreading on the substrate.

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