Abstract
With the advent of layered synthetic microstructure (LSM) technology, high-reflectivity narrow-band XUV filters, and LSM coated gratings become available, thus making possible normal-incidence high-throughput devices in the 10–200 Å range. Therefore it may become feasible to measure rapid (τ∼10−6 s) fluctuations of the electron density and temperature in the hot central region of the tokamak plasma, by measuring fluctuations on the L-shell charge-state line emissions. We present and discuss the linear dependence of correlated line intensity fluctuations on local T̃e and ñe. Various configurations for the proposed measurements are presented and evaluated.
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