Abstract
A fast two-dimensional measurement system of birefringence dispersion is developed for inspection of LCD retardation film. An optical arrangement of this system consists of a polarizer, a carrier retarder and an analyzer. The carrier retarder can be introduced a carrier frequency into an intensity distribution along wave number. A Xenon flash lamp is employed as a white light source and synchronized with the line type of imaging spectrometer. The detected intensity distribution changes the sinusoidal wave along wave number. A phase distribution is calculated by Fourier transform method. The retardation distribution of a polymer sample is analyzed to subtract phase distributions with and without the sample. In the experiments, the some polymer films are measured as demonstrations and evaluated to the non-uniformity of retardation distribution.
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