Abstract
A fast operating device for thickness measurement of transparent films has been designed and tested. Its principle of operation is based on the film reflection dependence on the laser beam incidence angle. The alteration of the incidence angle is produced by means of nonspherical optics. The single measurement time is less than 0.001 s, so this device allows the measurement of film thickness irregularities and investigation of the spreading liquid film thickness kinetics. The measurement frequency is 50 per second.
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