Abstract

A novel automated spectral measurement system is presented. Special attention has been focused on the design in order to obtain rapid measurement facilities, minimize hardware and simplify serial communications between the different subsystems involved, resulting in a low-cost measurement system. It is controlled by an HP-9000 computer, through a fully menu-driven interface, and the primary measurement instrument is an HP-4142B modular source-monitor. A new indicator of measurement accuracy is defined, implemented and displayed in real time. This automated system has been employed intensively to study characteristics of different solar cell types in order to optimize their fabrication process. As such this automated measurement system is clearly useful for both research and fabrication.

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