Abstract
Abstract In the fields of customs inspection, airport security inspection, medical diagnosis, industrial inspection and arms control verification, it is often necessary to use radiography to determine whether the targeted object is contained in a closed container. By analyzing whether the specific figure of the targeted object is contained in the irradiation image of the closed container, we can determine if the container should be opened for a further manual check. In many cases, considering the time cost of radiography, the determination should be made as soon as possible, which requires fast analysis of the figure information of the irradiation image. In this paper, a fast figure determination method based on the sequential Bayesian analysis is proposed. This method applies the sequential Bayesian analysis to the irradiation image analysis, and can make a fast determination of the existence of the specific figure according to the location information of the ray particles in the irradiation image. First, the theoretical framework of this method was established in this paper. Second, the mathematical model of this method was established, and its feasibility was also studied. The research results show that, this method can make an accurate and fast determination of the existence of the targeted figure in the irradiation image. Third, the factors influencing the figure determination speed of this method was analyzed in depth. At last, a Monte Carlo simulation study of this method was carried out: the physical model of the inspection scheme of industrial materials based on the X-ray transmission imaging was established, and the figure determination method proposed by this paper can make an accurate and fast determination of the existence of hole defects in the industrial materials according to the X-ray transmission images of the industrial materials, which proves the feasibility of the application of this method in radiography.
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More From: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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