Abstract
A time-of-flight (ToF) setup using a pulsed ion beam was designed in order to optimize the depth resolution of medium energy backscattering towards the sub-nm range. Short pulses were produced by deflection of an ion beam across an aperture using a fast high voltage transistor switch. Ion pulses in the range of some 100 ps were produced. The resulting time resolution of the setup was 550 ± 125 ps for the scattering of 100 keV protons at a gold surface. Ray tracing calculations revealed that the fast deflection leads to a shift of the mean ion energy and additionally to an energy spread causing a dispersion of the pulses.
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