A fast alignment method for grating-based X-ray phase-contrast imaging systems

Abstract

The alignment of a grating-based X-ray phase-contrast interferometer is an iterative process that requires numerous steps of changing the distances and angles between the gratings. For each alignment step an image is acquired to evaluate the detected intensity signature in order to optimize the observed moir'e pattern. Thus, a large number of images has to be taken for the alignment procedure. This is not feasible within reasonable time at X-ray sources like X-ray backlighters where the time between two X-ray shots is on the scale of hours. Here, we report on the development of a stable and transportable setup ready-to-use for grating-based X-ray phase-contrast imaging. A comprehensive set of reference images taken at a continuous beam serves as a look-up table which enables the grating alignment within very few alignment steps. Since this method features a fast, reliable and predictable alignment, it is also beneficial for grating-based X-ray phase-contrast imaging systems at common X-ray sources.