Abstract

A relatively simple apparatus has been developed for the direct measurement of the intensities of low energy electron diffraction (LEED) beams from the surface of a single crystal target. The energy and angular distributions of all the electrons inelastically scattered or emitted from a single crystal or polycrystalline target surface, monitored by LEED, can also be measured in this apparatus. LEED and electron or ultraviolet light induced electron emission measurements may be observed over a solid angle of emission of 3 π st. The apparatus includes a service area, for preparing crystal surfaces under u.h.v. conditions, and manipulation devices, for transferring the specimen from the service area to the measuring area, and orienting its surface for a wide range of angles of incidence of the primary electron beam.

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